Eisterer M., Scheuerlein C., Taborelli M., Member, IEEE, Piccin R., Parragh D.M., Ravotti F., Pezzullo G., Ternova D., Lehner M.
Eisterer M., Bruzzone P., Celentano G., Jirsa M., Laviano F., Nijhuis A., Muzzi L., Corato V., Rames M., Sedlak K., Duran I., Torsello D., Bykovskiy N., Anniballi G.
Eisterer M., Puig T., Obradors X., Moshchil V.E., Buchner B., Karpets M.V., Kvitnitskaya O.E., He R., Kluge R., Bodenseher A., Prikhna T.O., Kielak L., Gass S., Borymskiy O.I., Efremov D., Gumen O.M.
Ключевые слова: LTS, bulk, fabrication, sintering, microstructure, X-ray diffraction, lattice parameter, composition, critical temperature, resistive transition, magnetization
Eisterer M., Hopkins S.C., Ballarino A., Baumgartner T., Bernardi J., Pfeiffer S., Stoger-Pollach M., Loffler S.
Eisterer M., Sokolovsky V., Werfel F.N., Moshchil V.E., Sverdun V.B., Prikhna T., Buchner B., Karpets M.V., Lindackers D., Ponomaryov S.S., Kluge R., Bodenseher A., Filzmoser J., Flogel–Delor U., Vakaliuk A.
Ключевые слова: MgB2, doping effect, hot pressing, Jc/B curves, bulk, cylinders, trapped field, temperature dependence, cryogenic systems, hydrogen liquid, microstructure, YBCO, comparison
Ключевые слова: LTS, Nb3Sn, wires, RRP process, irradiation effects, neutron irradiation, atom probe tomography, nanoscaled effects, pinning force, experimental results
Eisterer M., Speller S.C., Grovenor C.R., Fischer D., He G., Iliffe W., Adams K., Nicholls R.J., Diaz-Moreno S., Mosselmans F.
Eisterer M., Chaud X., Tomsic M., Prikhna T.A., Moshchil V.E., Sverdun V.B., Rabier J., Rindfleisch M., Shapovalov A.P., Kasatkin A.L., Shaternik A.V., Romaka V.V., Ponomaryov S.S., Jouline A.
Ключевые слова: HTS, YBCO, coated conductors, fabrication, PLD process, RABITS process, doping effect, pinning centers artificial, microstructure, density, grain alignment, measurement technique, Hall sensor, critical caracteristics, Jc/B curves, local distribution, critical current density, experimental results
Ключевые слова: HTS, YBCO, doping effect, coated conductors, IBAD process, RABITS process, template layers, films, substrate SrTiO3, PLD process, comparison, microstructure, electron diffraction, distribution, X-ray diffraction, lattice parameter, magnetization, temperature dependence, critical current density, distribution, experimental results
Ключевые слова: chalcogenide, FeSeTe, coated conductors, PLD process, IBAD process, RABITS process, substrate Hastelloy, template layers, thin films, substrate single crystal, comparison, X-ray diffraction, lattice parameter, resistive transition, magnetization, temperature dependence, critical caracteristics, Jc/B curves, microstructure, fabrication, experimental results
Ключевые слова: LTS, Nb3Sn, wires multifilamentary, magnetization, pinning centers artificial, magnetic moment, remanent field, experimental results
Eisterer M., Hopkins S.C., Pantsyrny V., Abdyukhanov I.M., Alekseev M., Bernardi J., Tsapleva A., Ortino M., Moros A., Stoger-Pollach M., Lukyanov P., Loffler S.
Ключевые слова: FCC, LTS, Nb3Sn, wires, microstructure, composition, distribution, gradient, experimental results
Eisterer M., Chaud X., Tomsic M., Rabier J., Rindfleisch M., Prikhna T., Moshchil V., Shapovalov A., Kasatkin A., Jouline A., Ponomaryov S.
Ключевые слова: HTS, YBCO, bulk, texture, melting, MgB2, thin films, bulk, wires round, microstructure, critical current, Jc/B curves, pinning force, experimental results
Ключевые слова: HTS, YBCO, coated conductors, tapes, neutron irradiation, irradiation effects, microstructure, experimental results, damage mechanisms
Sedlak K., Anvar V.A., Bagrets N., Biancolini M.E., Bonifetto R., Bonne F., Boso D., Brighenti A., Bruzzone P., Celentano G., Chiappa A., D'Auria V., Dan M., Decool P.*10, Corte A.D., Dembkowska A.*11, Dicuonzo O., Duran I.*12, Eisterer M.*13, Ferro A., Zignani C.F., Fietz W.H., Frittitta C., Gaio E., Giannini L., Giorgetti F., Gomory F.*14, Granados X.*15, Guarino R., Heller R., Hoa C., Ivashov I.*16, Jiolat G.*10, Jirsa M.*17, Jose B.*10, Kembleton R.*18, Kumar M., Lacroix B.*10, Coz Q.L.*19, Lewandowska M.*11, Maistrello A., Misiara N.*10, Morici L., Muzzi L., Nicollet S.*10, Nijhuis A., Nunio F.*10, Portafaix C.*10, Romanelli G., Sarasola X., Savoldi L., Stepanov B., Tiseanu I.*20, Tomassetti G., Torre A.*10, Turtщ S., Uglietti D., Vallcorba R.*10, Viererbl L.*21, Vojenciak M.*14, Vorpahl C.*18, Weiss K., Wesche R., Wolf M.J., Zani L.*10, Zanino R., Zappatore A., Corato V.
Ferdeghini C., Eisterer M., Vaglio R., Putti M., Bernini C., Calatroni S., Bellingeri E., Holleis S., Bernardi J., Leveratto A., Saba A., Himmerlich M., Henrist B., Fernandez-Pena S., Moros A.
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